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Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory
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1847 since deposited on 2021-10-16
Acq. date: 2025-10-24
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Views
1847 since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations