Publication:
Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory
Date
| dc.contributor.author | Srinivasan, Purushothaman | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Misra, D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T05:22:54Z | |
| dc.date.available | 2021-10-16T05:22:54Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11263 | |
| dc.source.beginpage | 231 | |
| dc.source.conference | Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF | |
| dc.source.conferencedate | 19/09/2005 | |
| dc.source.conferencelocation | Salamanca Spain | |
| dc.source.endpage | 234 | |
| dc.title | Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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