Browsing by author "Vegh, Gerzson"

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Analysis of irradiation induced defects in silicon devices

Vegh, Gerzson; Simoen, Eddy; Vanhellemont, Jan; Claeys, C. (1995)
Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

Rotondaro, Antonio; Hurd, Trace; Mertens, Paul; Schmidt, Harald; Heyns, Marc; Simoen, Eddy; Vanhellemont, Jan; Vegh, Gerzson; Claeys, Cor; Gräf, D. (1994)