Authors

Rotondaro, Antonio; Hurd, Trace; Mertens, Paul; Schmidt, Harald; Heyns, Marc; Simoen, Eddy; Vanhellemont, Jan; Vegh, Gerzson; Claeys, Cor; Gräf, D.

Conference

186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III

Title

Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

Publication type

Meeting abstract

Embargo date

9999-12-31