Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
Publication:
Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
Date
1994
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
317.pdf
199.53 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rotondaro, Antonio
;
Hurd, Trace
;
Mertens, Paul
;
Schmidt, Harald
;
Heyns, Marc
;
Simoen, Eddy
;
Vanhellemont, Jan
;
Vegh, Gerzson
;
Claeys, Cor
;
Gräf, D.
Journal
Abstract
Description
Metrics
Views
2125
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2125
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations