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Conference contributions
Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
Publication:
Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon
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Date
1994
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rotondaro, Antonio
;
Hurd, Trace
;
Mertens, Paul
;
Schmidt, Harald
;
Heyns, Marc
;
Simoen, Eddy
;
Vanhellemont, Jan
;
Vegh, Gerzson
;
Claeys, Cor
;
Gräf, D.
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2128
since deposited on 2021-09-29
Acq. date: 2026-01-08
Citations
Metrics
Views
2128
since deposited on 2021-09-29
Acq. date: 2026-01-08
Citations