Publication:

Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

Date

1994
Meeting abstract
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-5218-4046
cris.virtualsource.department715a9ada-0798-46d2-a8ca-4775db9a8e46
cris.virtualsource.orcid715a9ada-0798-46d2-a8ca-4775db9a8e46
dc.contributor.authorRotondaro, Antonio
dc.contributor.authorHurd, Trace
dc.contributor.authorMertens, Paul
dc.contributor.authorSchmidt, Harald
dc.contributor.authorHeyns, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorVegh, Gerzson
dc.contributor.authorClaeys, Cor
dc.contributor.authorGräf, D.
dc.contributor.imecauthorMertens, Paul
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T12:46:30Z
dc.date.available2021-09-29T12:46:30Z
dc.date.embargo9999-12-31
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/324
dc.source.beginpage625
dc.source.conference186th Electrochemical Society Fall Meeting: Symposium on High Purity Silicon III
dc.source.conferencedate9/10/1994
dc.source.conferencelocationMiami, FL USA
dc.title

Limitations of minority carrier lifetime as a parameter for evaluating iron contamination in silicon

dc.typeMeeting abstract
dspace.entity.typePublication
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