Browsing by author "Kohiki, S."
Now showing items 1-4 of 4
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Degradation and recovery of In0.53Ga0.47As photodiodes by 1-MeV fast neutrons
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Hakata, T.; Kohiki, S.; Sunaga, H. (1996) -
Degradation of InGaAs pin photodiodes by neutron irradiation
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudou, T.; Kohiki, S.; Sunaga, H.; Hakata, T. (1996) -
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S. (2000) -
Radiation damage of N-MOSFETS fabricated in a BiCMOS process
Kobayashi, K.; Ohyama, Hidenori; Yoneoka, M.; Hayama, Kiyoteru; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami., Y.; Takizawa, H.; Kohiki, S. (2001)