Radiation damage of n-MOSFETs fabricated in a BiCMOS process

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Authors
Ohyama, Hidenori; Kobayashi, K.; Nakabayashi, M.; Simoen, Eddy; Claeys, Cor; Takami, Y.; Yoneoka, M.; Hayama, Kiyoteru; Takizawa, H.; Kohiki, S.
Conference
3rd International Conference Materials for Microelectronics
Title
Radiation damage of n-MOSFETs fabricated in a BiCMOS process
Publication type
Proceedings paper
Embargo date
9999-12-31
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