Publication:

Radiation damage of n-MOSFETs fabricated in a BiCMOS process

Date

2000

Proceedings Paper

Simple item page Full metadata Statistics

Files

4632.pdf 316.95 KB

Author(s)

Ohyama, Hidenori

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;

Nakabayashi, M.

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;

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;

;

Hayama, Kiyoteru

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Metrics

2080 since deposited on 2021-10-14

Acq. date: 2025-12-09