Browsing by author "Polspoel, Wouter"
Now showing items 21-25 of 25
-
Nanoscale effects of annealing on the electrical characteristic of hafnium based devices measured in a vacuum environment
Aguilera, Lidia; Polspoel, Wouter; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008) -
Physical degradation of gate dielectrics induced by local electrical stress using conductive atomic force microscopy
Polspoel, Wouter; Favia, Paola; Mody, Jay; Bender, Hugo; Vandervorst, Wilfried (2009) -
Probing electrical properties of semiconductor structures on the nm-scale
Vandervorst, Wilfried; Meuris, Marc; De Wolf, P.; Alvarez, D.; Hantschel, Thomas; Trenkler, T.; Fouchier, M.; Duhayon, Natasja; Polspoel, Wouter; Mody, Jay (2008) -
Scanning spreading resistance microscopy for 3D-carrier Pprofiling in FinFET-based structures
Mody, Jay; Eyben, Pierre; Polspoel, Wouter; Jurczak, Gosia; Vandervorst, Wilfried (2008) -
Two dimensional electrical characterization of semiconductor devices under high vacuum conditions
Eyben, Pierre; Polspoel, Wouter; Mody, Jay; Vandervorst, Wilfried (2007)