Browsing by author "Wang, R."
Now showing items 1-3 of 3
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A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R. (2014) -
On the Contribution of Secondary Holes in Hot-Carrier Degradation a Compact Physics Modeling Perspective
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Z.; Makarov, Alexander; De Keersgieter, An; Vexler, M. I.; Vandemaele, Michiel; Wang, R.; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023) -
Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Ren, Pengpeng; Gao, R.; Ji, Zhigang; Arimura, Hiroaki; Zhang, J. F.; Wang, R.; Duan, M.; Zhang, W.; Franco, Jacopo; Sioncke, Sonja; Cott, Daire; Mitard, Jerome; Witters, Liesbeth; Mertens, Hans; Kaczer, Ben; Mocuta, Anda; Collaert, Nadine; Linten, Dimitri; Huang, R.; Thean, Aaron; Groeseneken, Guido (2016)