Publication:

Understanding charge traps for optimizing Si-passivated Ge nMOSFETs

Date

2016
Proceedings Paper
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Author(s)

Ren, Pengpeng
;
Gao, R.
;
Ji, Zhigang
;
Arimura, Hiroaki  
;
Zhang, J. F.
;
Wang, R.
;
Duan, M.
;
Zhang, W.
;
Franco, Jacopo  
;
Sioncke, Sonja
;
Cott, Daire  
;
Mitard, Jerome  
;
Witters, Liesbeth  
;
Mertens, Hans  
;
Kaczer, Ben  
;
Mocuta, Anda
;
Collaert, Nadine  
;
Linten, Dimitri  
;
Huang, R.
;
Thean, Aaron  
;
Groeseneken, Guido  

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1930 since deposited on 2021-10-23
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Acq. date: 2026-04-30

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