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Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Publication:
Understanding charge traps for optimizing Si-passivated Ge nMOSFETs
Date
2016
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ren, Pengpeng
;
Gao, R.
;
Ji, Zhigang
;
Arimura, Hiroaki
;
Zhang, J. F.
;
Wang, R.
;
Duan, M.
;
Zhang, W.
;
Franco, Jacopo
;
Sioncke, Sonja
;
Cott, Daire
;
Mitard, Jerome
;
Witters, Liesbeth
;
Mertens, Hans
;
Kaczer, Ben
;
Mocuta, Anda
;
Collaert, Nadine
;
Linten, Dimitri
;
Huang, R.
;
Thean, Aaron
;
Groeseneken, Guido
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1922
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1922
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations