A single device based Voltage Step Stress (VSS) technique for fast reliability screening

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Authors
Ji, Z.; Zhang, J. F.; Zhang, W. D.; Zhang, X.; Kaczer, Ben; De Gendt, Stefan; Groeseneken, Guido; Ren, P.; Wang, R.; Huang, R.
Conference
International Reliability Physics Symposium - IRPS
Title
A single device based Voltage Step Stress (VSS) technique for fast reliability screening
Publication type
Proceedings paper
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