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A single device based Voltage Step Stress (VSS) technique for fast reliability screening

Date

2014
Proceedings Paper
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dc.contributor.authorJi, Z.
dc.contributor.authorZhang, J. F.
dc.contributor.authorZhang, W. D.
dc.contributor.authorZhang, X.
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorRen, P.
dc.contributor.authorWang, R.
dc.contributor.authorHuang, R.
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.accessioned2021-10-22T02:20:47Z
dc.date.available2021-10-22T02:20:47Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24008
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2014.6861145
dc.source.beginpageGD.2
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.title

A single device based Voltage Step Stress (VSS) technique for fast reliability screening

dc.typeProceedings paper
dspace.entity.typePublication
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