Browsing by author "Van Rossum, Marc"
Now showing items 1-20 of 73
-
'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
Wang, Connie; Nauwelaers, Bart; De Raedt, Walter; Van Rossum, Marc (1996) -
A 50 nm vertical Si0.70/Ge0.30/Si0.85/Ge0.15 pMOSFET with an oxide/nitride gate dielectric
Verheyen, Peter; Collaert, Nadine; Caymax, Matty; Loo, Roger; Van Rossum, Marc; De Meyer, Kristin (2001) -
A 70nm vertical Si/Si1-xGex heterojunction pMOSFET with reduced DIBL sensitivity for VLSI applications
Verheyen, Peter; Collaert, Nadine; Caymax, Matty; Loo, Roger; De Meyer, Kristin; Van Rossum, Marc (1999) -
A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
Watté, J.; Wuyts, Koen; Silverans, R. E.; Van Hove, Marleen; Van Rossum, Marc (1994) -
A high-gain coplanar GaAs PHEMT K-band dual-gate amplifier
Baeyens, Yves; Schreurs, Dominique; De Raedt, Walter; Nauwelaers, Bart; Van Rossum, Marc (1996) -
A new technique for in-fixture calibration using standards of constant length
Wan, Changhua; Nauwelaers, Bart; Schreurs, Dominique; De Raedt, Walter; Van Rossum, Marc (1998) -
A short guide to the PHANTOMS network
Van Rossum, Marc; Magnus, Wim (1994) -
A vertical Si/Si1-xGex heterojunction pMOSFET with reduced DIBL sensitivity, using a novel gate dielectric approach
Verheyen, P.; Collaert, Nadine; Caymax, Matty; Loo, Roger; De Meyer, Kristin; Van Rossum, Marc (1999) -
Automated generation of intrinsic large-signal HEMT models from S-parameter measurements
Schreurs, Dominique; Baeyens, S.; Nauwelaers, Bart; De Raedt, Walter; Van Rossum, Marc (1995) -
Characterization and modelling of HEMTs as microwave switches and millimetre wave MMIC switches
Schreurs, Dominique; Beheydt, Samie; Vanhaecke, Joachim; Baeyens, Yves; Nauwelaers, Bart; De Raedt, Walter; Van Hove, Marleen; Van Rossum, Marc (1995) -
Comparison of non-linear models based on linear and non-linear VNA measurements
Schreurs, Dominique; Verspecht, J.; Nauwelaers, Bart; Barel, A.; Van Rossum, Marc (1996) -
Complex permittivity measurement method based on asymmetry of reciprocal two-ports
Wan, C.; Nauwelaers, Bart; De Raedt, Walter; Van Rossum, Marc (1996) -
Consistent small-signal and large-signal extraction techniques for heterojunction FET's
Jansen, Philippe; Schreurs, Dominique; De Raedt, Walter; Nauwelaers, Bart; Van Rossum, Marc (1995) -
Coplanar amplifiers up to W-band using InP dual-gate HEMTs
Baeyens, Yves; van der Zanden, Koen; Schreurs, Dominique; Nauwelaers, Bart; Van Hove, Marleen; Van Rossum, Marc; Braunstein, J. (1997) -
DC, LF dispersion and RF characterisation of short-time stressed InP based LM-HEMTs
Schreurs, Dominique; Spiers, Ariane; De Raedt, Walter; van der Zanden, Koen; Baeyens, Yves; Van Hove, Marleen; Nauwelaers, Bart; Van Rossum, Marc (1996) -
De-embedding MICs/MMICs in fixed-length fixtures: use of symmetric two-port transmission-line discontinuities
Wang, Connie; Nauwelaers, Bart; De Raedt, Walter; Van Rossum, Marc (1996) -
Delay Times in Lattice Matched InGaAs/InP HEMT's with Gatelengths between 80 and 250 nm
Finders, Jo; Baeyens, Yves; Schreurs, Dominique; Van Hove, Marleen; De Raedt, Walter; Nauwelaers, Bart; Van Rossum, Marc (1995) -
Development of advanced GaAs components for space applications
Van Rossum, Marc (1996) -
Direct extraction of the non-linear model for two-port devices from vectorial non-linear network analyser measurements
Schreurs, Dominique; Verspecht, J.; Nauwelaers, Bart; Van de Capelle, A.; Van Rossum, Marc (1997) -
Distribution of fields and charge carriers in cylindrical and planar nanosize structures
Pokatilov, E. P.; Balaban, S. N.; Klimin, S. N.; Fomin, V. M.; Devreese, J. T.; Magnus, Wim; Van Rossum, Marc; De Meyer, Kristin; Schoenmaker, Wim (1998)