Browsing by author "Bufler, Fabian"
Now showing items 1-15 of 15
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3D sequential stacked planar devices featuring low-temperature replacement metal gate junctionless top devices with improved reliability
Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018-11) -
3D sequential stacked planar devices on 300 mm wafers featuring replacement metal gate junction-less top devices processed at 525°C with improved reliability
Vandooren, Anne; Franco, Jacopo; Parvais, Bertrand; Wu, Zhicheng; Witters, Liesbeth; Walke, Amey; Li, Waikin; Peng, Lan; Deshpande, Veeresh Vidyadhar; Bufler, Fabian; Rassoul, Nouredine; Hellings, Geert; Jamieson, Geraldine; Inoue, Fumihiro; Verbinnen, Greet; Devriendt, Katia; Teugels, Lieve; Heylen, Nancy; Vecchio, Emma; Tao, Zheng; Rosseel, Erik; Vanherle, Wendy; Hikavyy, Andriy; Chan, BT; Ritzenthaler, Romain; Besnard, Guillaume; Schwarzenbach, Walter; Gaudin, Gweltaz; Radu, Ionut; Nguyen, Bich-Yen; Waldron, Niamh; De Heyn, Vincent; Mocuta, Dan; Collaert, Nadine (2018) -
Comparison of Electrical Performance of Co-Integrated Forksheets and Nanosheets Transistors for the 2nm Technological Node and Beyond
Ritzenthaler, Romain; Mertens, Hans; Eneman, Geert; Simoen, Eddy; Bury, Erik; Eyben, Pierre; Bufler, Fabian; Oniki, Yusuke; Briggs, Basoene; Chan, BT; Hikavyy, Andriy; Mannaert, Geert; Parvais, Bertrand; Vaisman Chasin, Adrian; Mitard, Jerome; Dentoni Litta, Eugenio; Samavedam, Sri; Horiguchi, Naoto (2021) -
Experimental Validation of Process-Induced Variability Aware SPICE Simulation Platform for Sub-20 nm FinFET Technologies
Rawat, Amita; Sharan, Neha; Jang, Doyoung; Chiarella, Thomas; Bufler, Fabian; Catthoor, Francky; Parvais, Bertrand; Ganguly, Udayan (2021) -
Ge Devices: a potential candidate for sub-5nm nodes?
Sharan, Neha; Shaik, Khaja Ahmad; Jang, Doyoung; Schuddinck, Pieter; Yakimets, Dmitry; Garcia Bardon, Marie; Mitard, Jerome; Arimura, Hiroaki; Bufler, Fabian; Eneman, Geert; Collaert, Nadine; Parvais, Bertrand; Spessot, Alessio; Mocuta, Anda (2019) -
Monte Carlo Analysis of p-Type Si0.75Ge0.25-Channel Nanosheet Performance
Bufler, Fabian; Arimura, Hiroaki; Favia, Paola; Eneman, Geert; Matagne, Philippe; Horiguchi, Naoto; Hellings, Geert (2022) -
Monte Carlo benchmark of In0.53Ga0.47As- and silicon-FinFETs
Bufler, Fabian; Eneman, Geert; Collaert, Nadine; Mocuta, Anda (2017) -
Monte Carlo comparison of n-type and p-type nanosheets with FinFETs: Effect of the number of sheets
Bufler, Fabian; Jang, Doyoung; Hellings, Geert; Eneman, Geert; Matagne, Philippe; Spessot, Alessio; Na, Myung Hee (2020) -
Multiphysics simulation & design of silicon quantum dot Qubit devices
Mohiyaddin, Fahd Ayyalil; Simion, George; Dumoulin Stuyck, Nard; Li, Roy; Ciubotaru, Florin; Eneman, Geert; Bufler, Fabian; Kubicek, Stefan; Jussot, Julien; Chan, BT; Ivanov, Tsvetan; Spessot, Alessio; Matagne, Philippe; Lee, James; Govoreanu, Bogdan; Radu, Iuliana (2019) -
On the ballistic ratio in 14nm-node FinFETs
Bufler, Fabian; Miyaguchi, Kenichi; Chiarella, Thomas; Horiguchi, Naoto; Mocuta, Anda (2017) -
Performance comparison of N-Type Si nanowires, nanosheets and FinFETs by MC device simulation
Bufler, Fabian; Ritzenthaler, Romain; Mertens, Hans; Eneman, Geert; Mocuta, Anda; Horiguchi, Naoto (2018-11) -
PPAC of sheet-based CFET configurations for 4 track design with 16nm metal pitch
Roda Neve, César; Schuddinck, Pieter; Bufler, Fabian; Xiang, Yang; Farokhnejad, Anita; Mirabelli, Gioele; Vandooren, Anne; Chehab, Bilal; Gupta, Anshul; Hellings, Geert; Ryckaert, Julien (2022-06) -
Single and double diffusion breaks in 14nm FinFET and beyond
Miyaguchi, Kenichi; Bufler, Fabian; Chiarella, Thomas; Matagne, Philippe; Horiguchi, Naoto; De Keersgieter, An; Eneman, Geert; Parvais, Bertrand; Mocuta, Anda; Spessot, Alessio; Verkest, Diederik (2017) -
TCAD-Assisted MultiPhysics Modeling & Simulation for Accelerating Silicon Quantum Dot Qubit Design
Mohiyaddin, Fahd Ayyalil; Simion, George; Dumoulin Stuyck, Nard; Li, Roy; Elsayed, Asser; Shehata, Mohamed; Kubicek, Stefan; Godfrin, Clement; Chan, BT; Jussot, Julien; Ciubotaru, Florin; Brebels, Steven; Bufler, Fabian; Eneman, Geert; Weckx, Pieter; Matagne, Philippe; Spessot, Alessio; Govoreanu, Bogdan; Radu, Iuliana (2020) -
Toward the Super Temporal Resolution Image Sensor with a Germanium Photodiode for Visible Light
Nguyen Hoai Ngo; Anh Quang Nguyen; Bufler, Fabian; Kamakura, Yoshinari; Mutoh, Hideki; Shimura, Takayoshi; Hosoi, Takuji; Watanabe, Heiji; Matagne, Philippe; Shimonomura, Kazuhiro; Takehara, Kohsei; Charbon, Edoardo; Etoh, Takeharu Goji (2020)