Browsing by author "den Dekker, A.J."
Now showing items 1-4 of 4
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A workflow to reconstruct grating-based X-ray phase contrast CT images: application to CFRP samples
Sanctorum, J.; Janssens, Eline; den Dekker, A.J.; Senck, S.; Heinzl, C.; De Beenhouwer, Jan; Sijbers, Jan (2017) -
Atom column detection from STEM images using the maximum a posteriori probability rule
Fatermans, J.; den Dekker, A.J.; O'Leary, C.M.; Nellist, P.D.; Van Aert, S. (2019) -
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, Jan; Van Aert, S. (2017-03) -
Super-resolution multi-PLD PCASL: a simulation study
Bladt, P.; Beirinckx, Q.; Van Steenkiste, G.; Jeurissen, B.; Achten, E.; den Dekker, A.J.; Sijbers, Jan (2017)