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Conference contributions
Atom column detection from STEM images using the maximum a posteriori probability rule
Publication:
Atom column detection from STEM images using the maximum a posteriori probability rule
Date
2019
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den Dekker, A.J.
;
O'Leary, C.M.
;
Nellist, P.D.
;
Van Aert, S.
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Abstract
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1951
since deposited on 2021-10-27
Acq. date: 2025-10-27
Citations
Metrics
Views
1951
since deposited on 2021-10-27
Acq. date: 2025-10-27
Citations