Publication:
Atom column detection from STEM images using the maximum a posteriori probability rule
Date
| dc.contributor.author | Fatermans, J. | |
| dc.contributor.author | den Dekker, A.J. | |
| dc.contributor.author | O'Leary, C.M. | |
| dc.contributor.author | Nellist, P.D. | |
| dc.contributor.author | Van Aert, S. | |
| dc.date.accessioned | 2021-10-27T09:08:57Z | |
| dc.date.available | 2021-10-27T09:08:57Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32950 | |
| dc.identifier.url | https://visielab.uantwerpen.be/publications/atom-column-detection-stem-images-using-maximum-posteriori-probability-rule | |
| dc.source.conference | Microscopy Conference 2019 | |
| dc.source.conferencedate | 1/09/2019 | |
| dc.source.conferencelocation | Berlin Germany | |
| dc.title | Atom column detection from STEM images using the maximum a posteriori probability rule | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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