Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question

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Authors
Gonnissen, J.; De Backer, A.; den Dekker, A.J.; Sijbers, Jan; Van Aert, S.
ISSN
0304-3991
Journal
Ultramicroscopy
Volume
174
Title
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
Publication type
Journal article
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