Publication:
Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
Date
| dc.contributor.author | Gonnissen, J. | |
| dc.contributor.author | De Backer, A. | |
| dc.contributor.author | den Dekker, A.J. | |
| dc.contributor.author | Sijbers, Jan | |
| dc.contributor.author | Van Aert, S. | |
| dc.contributor.imecauthor | Sijbers, Jan | |
| dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
| dc.date.accessioned | 2021-10-24T05:08:08Z | |
| dc.date.available | 2021-10-24T05:08:08Z | |
| dc.date.issued | 2017-03 | |
| dc.identifier.issn | 0304-3991 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/28408 | |
| dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0304399116302807?via%3Dihub | |
| dc.source.beginpage | 112 | |
| dc.source.endpage | 120 | |
| dc.source.journal | Ultramicroscopy | |
| dc.source.volume | 174 | |
| dc.title | Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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