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Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
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Atom-counting in High Resolution Electron Microscopy: TEM or STEM – That's the question
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Date
2017-03
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gonnissen, J.
;
De Backer, A.
;
den Dekker, A.J.
;
Sijbers, Jan
;
Van Aert, S.
Journal
Ultramicroscopy
Abstract
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1938
since deposited on 2021-10-24
1
last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1938
since deposited on 2021-10-24
1
last month
Acq. date: 2026-01-11
Citations