Browsing by author "Pangon, Nadège"
Now showing items 1-6 of 6
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A new physically-based model for temperature acceleration of time-to-breakdown
Pangon, Nadège; Degraeve, Robin; Roussel, Philippe; Groeseneken, Guido; Maes, Herman; Crupi, Felice (1998) -
Investigation of properties of SiO2 defects created during electric stressing at different temperatures
Kaczer, Ben; Degraeve, Robin; Pangon, Nadège; Groeseneken, Guido (1999) -
Investigation of temperature acceleration of thin oxide time-to-breakdown
Kaczer, Ben; Degraeve, Robin; Pangon, Nadège; Nigam, Tanya; Groeseneken, Guido (1999) -
Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability
Degraeve, Robin; Pangon, Nadège; Kaczer, Ben; Nigam, Tanya; Groeseneken, Guido; Naem, Abdalla (1999) -
The effect of elevated temperature on the reliability of very thin oxide films
Kaczer, Ben; Degraeve, Robin; Pangon, Nadège; Nigam, Tanya; Groeseneken, Guido (1999) -
The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films
Kaczer, Ben; Degraeve, Robin; Pangon, Nadège; Groeseneken, Guido (2000)