Authors

Degraeve, Robin; Pangon, Nadège; Kaczer, Ben; Nigam, Tanya; Groeseneken, Guido; Naem, Abdalla

Conference

Symposium on VLSI Technology: Technical Digest; June 1999; Kyoto, Japan.

Title

Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliability

Publication type

Proceedings paper