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Investigation of temperature acceleration of thin oxide time-to-breakdown
Publication:
Investigation of temperature acceleration of thin oxide time-to-breakdown
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kaczer, Ben
;
Degraeve, Robin
;
Pangon, Nadège
;
Nigam, Tanya
;
Groeseneken, Guido
Journal
Microelectronic Engineering
Abstract
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1925
since deposited on 2021-10-06
417
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Acq. date: 2025-10-25
Citations
Metrics
Views
1925
since deposited on 2021-10-06
417
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations