Publication:

Investigation of temperature acceleration of thin oxide time-to-breakdown

Date

1999
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorKaczer, Ben
dc.contributor.authorDegraeve, Robin
dc.contributor.authorPangon, Nadège
dc.contributor.authorNigam, Tanya
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-06T11:28:27Z
dc.date.available2021-10-06T11:28:27Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3547
dc.source.beginpage47
dc.source.endpage50
dc.source.issue1_4
dc.source.journalMicroelectronic Engineering
dc.source.volume48
dc.title

Investigation of temperature acceleration of thin oxide time-to-breakdown

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
3512.pdf
Size:
1.03 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles