Browsing by author "Vexler, Mikhail I."
Now showing items 1-1 of 1
-
Hot-carrier degradation modeling of decananometer nMOSFETs using the drift-diffusion approach
Sharma, Prateek; Tyaginov, Stanislav; Rauch, Stewart E. III; Franco, Jacopo; Makarov, Alexander; Vexler, Mikhail I.; Kaczer, Ben; Grasser, Tibor (2017)