Browsing by author "Agaiby, Rouzet M. B."
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Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices
Agaiby, Rouzet M. B.; Olsen, Sarah; Eneman, Geert; Simoen, Eddy; Augendre, Emmanuel; O'Neill, Anthony G. (2010)