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    • HBM ESD robustness of GaN-on-Si Schottky diodes 

      Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, A.; Lafonteese, D.; Concannon, A.; Vashchenko, V.A.; Hopper, P.; Bychikhin, S.; Pogany, D.; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2012)