Publication:

HBM ESD robustness of GaN-on-Si Schottky diodes

Date

2012

Journal article

Simple item page Full metadata Statistics

Files

24646.pdf 1.88 MB

Author(s)

Chen, Shih-Hung

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Griffoni, Alessio

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Srivastava, Puneet

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Linten, Dimitri

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Vashchenko, V.A.

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Van Hove, Marleen

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Decoutere, Stefaan

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Groeseneken, Guido

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

2010 since deposited on 2021-10-20

1last month

Acq. date: 2026-01-07