HBM ESD robustness of GaN-on-Si Schottky diodes

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Author(s)

Chen, Shih-Hung

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Griffoni, Alessio

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Srivastava, Puneet

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Linten, Dimitri

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Vashchenko, V.A.

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Van Hove, Marleen

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Decoutere, Stefaan

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Groeseneken, Guido

Journal

IEEE Transactions on Device and Materials Reliability

Metrics

2006 since deposited on 2021-10-20

Acq. date: 2025-10-23