Browsing by author "Sawada,"
Now showing items 1-3 of 3
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Analysis of high voltage ESD protection devices under HBM ESD stress
Linten, Dimitri; Vashchenko, Vlad; Scholz, Mirko; Jansen, Philippe; Lafonteese, David; Thijs, Steven; Sawada,; Hasebe,; Hopper, Peter; Groeseneken, Guido (2008-05) -
Characterization and modeling of diodes in sub-45 nm CMOS technologies under HBM stress conditions
Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Tremouilles, David; Sawada,; Nakaei,; Hasebe,; Groeseneken, Guido (2007) -
Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Linten, Dimitri; Vashchenko, Vlad; Scholz, Mirko; Jansen, Philippe; Lafonteese, David; Thijs, Steven; Sawada,; Hasebe,; Hopper, Peter; Groeseneken, Guido (2008-09)