Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress

Thumbnail
Metadata
Show full item record
Authors
Linten, Dimitri; Vashchenko, Vlad; Scholz, Mirko; Jansen, Philippe; Lafonteese, David; Thijs, Steven; Sawada,; Hasebe,; Hopper, Peter; Groeseneken, Guido
Conference
30th EOS/ESD Symposium
Title
Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Publication type
Proceedings paper
Collections