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Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Publication:
Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress
Date
2008-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Linten, Dimitri
;
Vashchenko, Vlad
;
Scholz, Mirko
;
Jansen, Philippe
;
Lafonteese, David
;
Thijs, Steven
;
Sawada,
;
Hasebe,
;
Hopper, Peter
;
Groeseneken, Guido
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1963
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1963
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations