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Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress

Date

2008-09
Proceedings Paper
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dc.contributor.authorLinten, Dimitri
dc.contributor.authorVashchenko, Vlad
dc.contributor.authorScholz, Mirko
dc.contributor.authorJansen, Philippe
dc.contributor.authorLafonteese, David
dc.contributor.authorThijs, Steven
dc.contributor.authorSawada,
dc.contributor.authorHasebe,
dc.contributor.authorHopper, Peter
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.date.accessioned2021-10-17T08:25:47Z
dc.date.available2021-10-17T08:25:47Z
dc.date.issued2008-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14044
dc.source.beginpage204
dc.source.conference30th EOS/ESD Symposium
dc.source.conferencedate7/09/2008
dc.source.conferencelocationTucson, AZ USA
dc.source.endpage210
dc.title

Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress

dc.typeProceedings paper
dspace.entity.typePublication
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