Browsing by author "Claverie, Alain"
Now showing items 1-4 of 4
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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Hüe, Florian; Hytch, Martin; Bender, Hugo; Houdellier, Florent; Claverie, Alain (2008) -
Strain mapping in MOSFETs by transmission electron microscopy
Hüe, F.; Hytch, Martin; Lou, Nelson; Bender, Hugo; Claverie, Alain (2008) -
Strain mapping of tensile strained silicon transistors with embedded Si1yCy source and drain by dark-field holography
Hue, Florent; Hytch, Martin; Houdellier, Florent; Bender, Hugo; Claverie, Alain (2009) -
Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Hue, Florent; Houdellier, F.; Snoeck, E.; Hartmann, J.P.; Destefanis, V.; Bender, Hugo; Claverie, Alain; Hytch, Martin (2008-09)