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Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
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Acq. date: 2026-01-07
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Acq. date: 2026-01-07
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1 since deposited on 2021-10-17
Acq. date: 2026-01-07
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1868 since deposited on 2021-10-17
2last month
Acq. date: 2026-01-07
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