Publication:
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Downloads
1 since deposited on 2021-10-17
Acq. date: 2025-12-15
Views
1867 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2025-12-15
Citations
Metrics
Downloads
1 since deposited on 2021-10-17
Acq. date: 2025-12-15
Views
1867 since deposited on 2021-10-17
1last month
1last week
Acq. date: 2025-12-15
Citations