Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
Statistics
Statistics by Category
Download view's map
PNG
JPEG/JPG
Reports
Most viewed
Most viewed per month
Top city views
File Visits
Export Excel
Export CSV
Item
Views
Direct mapping of strain in a strained silicon transistor by high-resolution electron microscopy
1344