Browsing by author "McNally, P.J."

Now showing items 1-3 of 3

B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages

Cowley, A.; Ivankovic, A.; Wong, C.S; Bennett, N.S.; Danilewsky, A.N.; Gonzalez, Mario; Cherman, Vladimir; Vandevelde, Bart; De Wolf, Ingrid; McNally, P.J. (2016)
Determination of crystal misorientation in epitaxial lateral overgrowth of GaN

Chen, W.M.; McNally, P.J.; Jacobs, Koen; Tuomi, T.; Danilewsky, A.N.; Zytkiewicz, Z.R.; Lowney, D.; Kanatharana, J.; Knuuttila, L.; Riikonen, J. (2002)
Development of B-spline x-ray diffraction imaging techniques for die warpage and stress monitoring inside fully encapsulated packaged chips

Wong, C.S.; Ivankovic, Andrej; Cowley, A.; Bennett, N.S.; Danilewsky, A.; Gonzalez, Mario; Cherman, Vladimir; Vandevelde, Bart; De Wolf, Ingrid; McNally, P.J. (2014)