Authors

Cowley, A.; Ivankovic, A.; Wong, C.S; Bennett, N.S.; Danilewsky, A.N.; Gonzalez, Mario; Cherman, Vladimir; Vandevelde, Bart; De Wolf, Ingrid; McNally, P.J.

ISSN

0026-2714

Journal

Microelectronics Reliability

Volume

59

Title

B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages

Publication type

Journal article