Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages
Publication:
B-spline X-ray diffraction imaging – rapid non-destructive measurement of die warpage in ball grid array packages
Date
2016
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cowley, A.
;
Ivankovic, A.
;
Wong, C.S
;
Bennett, N.S.
;
Danilewsky, A.N.
;
Gonzalez, Mario
;
Cherman, Vladimir
;
Vandevelde, Bart
;
De Wolf, Ingrid
;
McNally, P.J.
Journal
Microelectronics Reliability
Abstract
Description
Metrics
Views
2122
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
2122
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations