Browsing by author "Schömann, S."
Now showing items 1-2 of 2
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High-resolution scanning spreading resistance microscopy of surrounding-gate transistors
Alvarez, D.; Schömann, S.; Goebel, B.; Manger, D.; Schlösser, T.; Slesazeck, S.; Hartwich, J.; Kretz, J.; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried (2004-01) -
New trends in the application of scanning probe techniques in failure analysis
Schweinbock, T.; Schömann, S.; Alvarez, David; Buzzo, M.; Frammelsberger, W.; Breitschopf, P.; Benstetter, G. (2004)