New trends in the application of scanning probe techniques in failure analysis

Simple item page Full metadata Statistics

Author(s)

Schweinbock, T.

;

Schömann, S.

;

Alvarez, David

;

Buzzo, M.

;

Frammelsberger, W.

;

Breitschopf, P.

;

Benstetter, G.

Journal

Microelectronics Reliability

Metrics

1955 since deposited on 2021-10-15

409item.page.metrics.field.last-week

Acq. date: 2025-10-25