Browsing by author "Hayashi, Y."
Now showing items 1-3 of 3
-
Characterization of EM faults on ATmega328p
Beckers, Arthur; Balasch, J.; Gierlichs, B.; Verbauwhede, I.; Osuka, S.; Kinugawa, M.; Fujimoto, D.; Hayashi, Y. (2019) -
Design and evaluation of a spark gap based EM-fault injection setup
Beckers, A.; Kinugawa, M.; Hayashi, Y.; Balasch, J.; Verbauwhede, I. (2020) -
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage
Osuka, S; Fujimoto, D.; Hayashi, Y.; Homma, N.; Beckers, A.; Balasch, J.; Gierlichs, B.; Verbauwhede, I. (2019)