Authors

Osuka, S; Fujimoto, D.; Hayashi, Y.; Homma, N.; Beckers, A.; Balasch, J.; Gierlichs, B.; Verbauwhede, I.

ISSN

0018-9375

Issue

4

Journal

IEEE Transactions on Electromagnetic Compatibility

Volume

1

Title

EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage

Publication type

Journal article

Embargo date

9999-12-31