Browsing by author "Stadler, Wolfgang"
Now showing items 1-5 of 5
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A traceable method for the arc-free characterization and modeling of CDM testers and pulse metrology chains
Gieser, Horst A.; Wolf, Heinrich; Soldner, Wolfgang; Reichl, Herbert; Andreini, Antonio; Mahadeva Iyer, Natarajan; Stadler, Wolfgang (2003-09) -
HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform
Muhonen, Kathleen; Ashton, Robert; Smedes, Theo; Scholz, Mirko; Velghe, Rudolf; Peachey, Nathaniel; Barth, Jon; Stadler, Wolfgang; Grund, Evan (2012-09) -
SCCF - System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Griffoni, Alessio; Russ, Christian; Stadler, Wolfgang; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010) -
System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Russ, Christian; Stadler, Wolfgang; Sawada, Masanori; Groeseneken, Guido (2010) -
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Stadler, Wolfgang; Esmark, K.; Reynders, K.; Zuhbeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, S.; Settler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2003)