Authors

Muhonen, Kathleen; Ashton, Robert; Smedes, Theo; Scholz, Mirko; Velghe, Rudolf; Peachey, Nathaniel; Barth, Jon; Stadler, Wolfgang; Grund, Evan

Conference

EOS/ESD Symposium

Title

HMM round robin study: What to expect when testing components to the IEC 61000-4-2 waveform

Publication type

Proceedings paper