Browsing by author "Alles, M.C."
Now showing items 1-3 of 3
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Efficient reliability testing of emerging memory technologies using multiple radiation sources
Bennet, W.G.; Hooten, N.C.; Weeded-Wright, S.; Schrimpf, R.D.; Reed, R.A.; Alles, M.C.; Zhang, E.X.; Mc Curdy, M.W.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea (2014) -
Heavy ion and laser induced charge collection in SiGe bulk PMOSFETs
Zhang, E.X.; Samsel, I.K.; Hooten, N.C.; Bennett, W.G.; Funkhouser, E.D.; Kai, N.; Ball, D.R.; McCurdy, M.W.; Fleetwood, D.M.; Reed, R.A.; Alles, M.C.; Schrimpf, R.D.; Linten, Dimitri; Mitard, Jerome (2014) -
TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories
Weeden-Wright, S.L.; Bennett, W.G.; Hooten, N.C.; Zhang, E.X.; McCurdy, M.W.; Schrimpf, R.D.; Reed, R.A.; Weller,; Fleetwood,; Alles, M.C.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea (2014)